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代表论著:

作者 题目 期刊名称 影响因子 年份 卷期
Wan, W.; Chen, F.-R.; Zhu, Y. Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons ULTRAMICROSCOPY 2.55 2018 194 143-153
Wan, W.; Yu, L.; Zhu, L.; Yang, X.; Wei, Z.; Liu, J. Z.; Feng, J.; Kunze, K.; Schaff, O.; Tromp, R.; Tang, W.-X. Design and commissioning of an aberration-corrected ultrafast spin polarized low energy electron microscope with multiple electron sources ULTRAMICROSCOPY 2.55 2017 174 89-96
R. M. Tromp*; J. B. Hannon; A. W. Ellis; W. Wan; A. Berghaus; O. Schaff A New Aberration-Corrected, Energy-Filtered LEEM/PEEM Instrument, I
A New Aberration-Corrected, Energy-Filtered LEEM/PEEM Instrument, I Principles and Design
ULTRAMICROSCOPY 2.55 2010 110 852-861
Wan, W.#*; Feng, J.; Padmore, H. A. A new separator design for aberration corrected
A new separator design for aberration corrected photoemission electron microscopes
Nuclear Instruments and Methods in Physical Research A 1.265 2006 564 537–543
W. Wan; J. Feng; H. A. Padmore; D. S. Robin Simulation of a mirror corrector for PEEM3 Nuclear Instruments and Methods in Physical Research A 1.265 2004 519 222-229